Search results for: Y. Liu
2017 IEEE International Reliability Physics Symposium (IRPS) > 4C-5.1 - 4C-5.6
2016 IEEE International Electron Devices Meeting (IEDM) > 36.5.1 - 36.5.4
IEEE Electron Device Letters > 2016 > 37 > 9 > 1193 - 1196
2016 IEEE International Reliability Physics Symposium (IRPS) > DI-8-1 - DI-8-5
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 1383 - 1387
2013 IEEE International Electron Devices Meeting > 9.4.1 - 9.4.4
2013 IEEE International Reliability Physics Symposium (IRPS) > PI.3.1 - PI.3.5
2013 IEEE International Reliability Physics Symposium (IRPS) > 4C.4.1 - 4C.4.4
2012 International Electron Devices Meeting > 14.4.1 - 14.4.4