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IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 99 - 105
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 923 - 929
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 52 - 58
IEEE Electron Device Letters > 2017 > 38 > 3 > 334 - 337
IEEE Journal of the Electron Devices Society > 2017 > 5 > 2 > 107 - 111
IEEE Photonics Journal > 2017 > 9 > 1 > 1 - 14
IEEE Electron Device Letters > 2017 > 38 > 2 > 160 - 163
IEEE Transactions on Electron Devices > 2017 > 64 > 2 > 634 - 637
IEEE Transactions on Electron Devices > 2017 > 64 > 2 > 407 - 411
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 200 - 205
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 170 - 175
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 153 - 158
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 37 - 44
IEEE Electron Device Letters > 2017 > 38 > 1 > 52 - 55
IEEE Journal of Photovoltaics > 2017 > 7 > 1 > 104 - 109
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 73 - 77
IEEE Journal of Photovoltaics > 2017 > 7 > 1 > 62 - 67
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 218 - 225
IEEE Access > 2017 > 5 > 21508 - 21523
IEEE Access > 2017 > 5 > 19322 - 19332