Search results for: Boualem Djezzar
International Journal of RF and Microwave Computer‐Aided Engineering > 31 > 10 > n/a - n/a
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 99 - 105
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 290 - 297
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 567 - 575
IEEE Transactions on Electron Devices > 2015 > 62 > 10 > 3285 - 3290
Microelectronics Reliability > 2014 > 54 > 5 > 882-888
Journal of Electronic Testing > 2014 > 30 > 4 > 415-423
Solid State Electronics > 2013 > 82 > Complete > 46-53
Microelectronics Reliability > 2013 > 53 > 4 > 513-519