Search results for: Cherifa Tahanout
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 99 - 105
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 567 - 575
IEEE Transactions on Electron Devices > 2015 > 62 > 10 > 3285 - 3290
Journal of Electronic Testing > 2014 > 30 > 4 > 415-423