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IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 44 - 49
IEEE Transactions on Electron Devices > 2011 > 58 > 1 > 216 - 223
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 800 - 807
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 1158 - 1163
2010 International Electron Devices Meeting > 34.3.1 - 34.3.4
IEEE Electron Device Letters > 2010 > 31 > 11 > 1181 - 1183
IEEE Transactions on Electron Devices > 2010 > 57 > 8 > 1889 - 1894
IEEE Transactions on Electron Devices > 2010 > 57 > 9 > 2067 - 2072