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IEEE Design & Test > 2017 > 34 > 3 > 59 - 67
IEEE Transactions on Industrial Electronics > 2017 > 64 > 6 > 4885 - 4893
2017 IEEE International Reliability Physics Symposium (IRPS) > CR-6.1 - CR-6.6
2017 IEEE International Reliability Physics Symposium (IRPS) > CR-8.1 - CR-8.4
2016 IEEE International Electron Devices Meeting (IEDM) > 15.3.1 - 15.3.4
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 8 > 2735 - 2744
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 2987 - 2993
IEEE Transactions on Industry Applications > 2016 > 52 > 4 > 3224 - 3233