Wyniki wyszukiwania
IEEE Design & Test > 2017 > 34 > 3 > 59 - 67
IEEE Transactions on Electron Devices > 2015 > 62 > 10 > 3133 - 3138
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 3 > 904 - 913
IEEE Transactions on Circuits and Systems I: Regular Papers > 2014 > 61 > 10 > 2920 - 2930
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2014 > 22 > 12 > 2738 - 2751
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 428 - 436