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IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 1979 - 1985
IEEE Electron Device Letters > 2017 > 38 > 12 > 1704 - 1707
IEEE Electron Device Letters > 2017 > 38 > 5 > 657 - 660
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1635 - 1641
IEEE Electron Device Letters > 2017 > 38 > 1 > 83 - 86
IEEE Electron Device Letters > 2016 > 37 > 10 > 1314 - 1317
2015 IEEE SENSORS > 1 - 3
IEEE Electron Device Letters > 2015 > 36 > 4 > 324 - 326
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3365 - 3370
2012 IEEE International Reliability Physics Symposium (IRPS) > 2C.4.1 - 2C.4.6