Search results
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4196 - 4200
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 8 > 2735 - 2744
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 4 > 743 - 751
IEEE Transactions on Nuclear Science > 2013 > 60 > 6-1 > 4498 - 4504
2011 International Reliability Physics Symposium > HV.1.1 - HV.1.4
IEEE Transactions on Nuclear Science > 2011 > 58 > 2 > 499 - 505
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 1170 - 1175