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IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2014 > 22 > 2 > 280 - 285
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 2 > 340 - 349
DAC Design Automation Conference 2012 > 139 - 144
IEEE Transactions on Electron Devices > 2012 > 59 > 11 > 3120 - 3123
2011 International Reliability Physics Symposium > XT.3.1 - XT.3.5
2010 International Electron Devices Meeting > 4.3.1 - 4.3.4
IEEE Design & Test of Computers > 2009 > 26 > 6 > 8 - 17