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IEEE Design & Test > 2017 > 34 > 3 > 59 - 67
IEEE Transactions on Information Forensics and Security > 2016 > 11 > 12 > 2804 - 2817
2016 IEEE International Reliability Physics Symposium (IRPS) > CR-2-1 - CR-2-4
IEEE Transactions on Electron Devices > 2015 > 62 > 10 > 3133 - 3138