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IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4091 - 4098
2017 IEEE International Reliability Physics Symposium (IRPS) > 2B-3.1 - 2B-3.5
2016 IEEE International Electron Devices Meeting (IEDM) > 33.4.1 - 33.4.4
2015 IEEE International Electron Devices Meeting (IEDM) > 21.6.1 - 21.6.4
2013 IEEE International Electron Devices Meeting > 15.2.1 - 15.2.4
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 497 - 506
IEEE Transactions on Nuclear Science > 2013 > 60 > 2-2 > 1373 - 1378
IEEE Electron Device Letters > 2012 > 33 > 12 > 1681 - 1683
2011 International Reliability Physics Symposium > PL.1.1 - PL.1.5
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 290 - 294