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IEEE Transactions on Circuits and Systems II: Express Briefs > 2016 > 63 > 11 > 1034 - 1038
IEEE Sensors Journal > 2013 > 13 > 6 > 2066 - 2076
IEEE Transactions on Circuits and Systems II: Express Briefs > 2012 > 59 > 11 > 726 - 730
IEEE Transactions on Electron Devices > 2012 > 59 > 7 > 1899 - 1905
2011 International Reliability Physics Symposium > 2B.6.1 - 2B.6.5
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 44 - 49
IEEE Transactions on Electron Devices > 2011 > 58 > 1 > 53 - 58
IEEE Transactions on Electron Devices > 2011 > 58 > 8 > 2347 - 2353
2010 IEEE International Reliability Physics Symposium > 1115 - 1116
IEEE Transactions on Nuclear Science > 2010 > 57 > 6-1 > 3570 - 3574
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2010 > 29 > 5 > 722 - 736
IEEE Transactions on Nuclear Science > 2010 > 57 > 4-1 > 1842 - 1848