Search results for: N Rezzak
Microelectronics Reliability > 2011 > 51 > 12 > 2093-2096
IEEE Transactions on Nuclear Science > 2011 > 58 > 6-1 > 2876 - 2882
IEEE Transactions on Nuclear Science > 2010 > 57 > 6-1 > 3288 - 3292
IEEE Transactions on Nuclear Science > 2010 > 57 > 6-1 > 3570 - 3574