Search results
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3470 - 3475
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3063 - 3070
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1808 - 1813
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1774 - 1778
IEEE Electron Device Letters > 2015 > 36 > 10 > 991 - 993
IEEE Transactions on Electron Devices > 2015 > 62 > 8 > 2390 - 2395
IEEE Transactions on Electron Devices > 2014 > 61 > 3 > 776 - 784
IEEE Transactions on Electron Devices > 2014 > 61 > 2 > 479 - 486
2013 IEEE International Reliability Physics Symposium (IRPS) > CR.1.1 - CR.1.5
IEEE Electron Device Letters > 2013 > 34 > 1 > 90 - 92
2012 International Electron Devices Meeting > 32.6.1 - 32.6.4
IEEE Transactions on Electron Devices > 2012 > 59 > 4 > 1023 - 1029
IEEE Electron Device Letters > 2012 > 33 > 5 > 655 - 657