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IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 685 - 687
IEEE Transactions on Electron Devices > 2014 > 61 > 8 > 2935 - 2943
IEEE Transactions on Electron Devices > 2014 > 61 > 3 > 801 - 805
2013 5th IEEE International Memory Workshop > 132 - 134
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2011 > 19 > 11 > 2023 - 2032
IEEE Electron Device Letters > 2011 > 32 > 1 > 81 - 83
IEEE Journal of Solid-State Circuits > 2011 > 46 > 10 > 2396 - 2405
IEEE Transactions on Nuclear Science > 2010 > 57 > 1-2 > 348 - 357