Search results for: Tom Schram
Advanced Materials > 34 > 48 > n/a - n/a
2017 IEEE International Reliability Physics Symposium (IRPS) > FA-5.1 - FA-5.4
IEEE Transactions on Electron Devices > 2016 > 63 > 7 > 2671 - 2676
IEEE Electron Device Letters > 2016 > 37 > 4 > 482 - 485
physica status solidi (a) > 213 > 2 > 245 - 254
physica status solidi (a) > 213 > 2 > 484 - 484
IEEE Journal of the Electron Devices Society > 2016 > 4 > 1 > 15 - 21
IEEE Transactions on Electron Devices > 2016 > 63 > 1 > 265 - 271
IEEE Electron Device Letters > 2015 > 36 > 6 > 600 - 602
IEEE Transactions on Electron Devices > 2014 > 61 > 8 > 2633 - 2639
IEEE Transactions on Electron Devices > 2014 > 61 > 8 > 2935 - 2943
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3081 - 3089
IEEE Electron Device Letters > 2014 > 35 > 9 > 957 - 959
IEEE Transactions on Electron Devices > 2013 > 60 > 8 > 2505 - 2511
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 323 - 334