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IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 376 - 383
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3354 - 3359
2013 IEEE International Reliability Physics Symposium (IRPS) > 2D.6.1 - 2D.6.9
IEEE Electron Device Letters > 2012 > 33 > 6 > 749 - 751
2011 International Reliability Physics Symposium > 2B.5.1 - 2B.5.5
2011 International Reliability Physics Symposium > FA.2.1 - FA.2.4
2011 International Reliability Physics Symposium > CR.1.1 - CR.1.4
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 44 - 49
IEEE Electron Device Letters > 2011 > 32 > 5 > 587 - 589
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 785 - 792
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-3 > 1332 - 1337
IEEE Electron Device Letters > 2011 > 32 > 5 > 650 - 652
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 118 - 125
IEEE Electron Device Letters > 2011 > 32 > 7 > 856 - 858