Search results for: Te-Kuang Chiang
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 291 - 297
IEEE Transactions on Nanotechnology > 2017 > 16 > 2 > 281 - 289
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4209 - 4217
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3354 - 3359
IEEE Transactions on Nanotechnology > 2016 > 15 > 3 > 442 - 447
IEEE Transactions on Nanotechnology > 2017 > 16 > 1 > 16 - 22
IEEE Transactions on Electron Devices > 2015 > 62 > 9 > 2745 - 2750
IEEE Transactions on Nanotechnology > 2015 > 14 > 3 > 555 - 560
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 1 > 35 - 39
Semiconductors > 2015 > 49 > 10 > 1361-1364
Semiconductors > 2015 > 49 > 2 > 254-258
Solid State Electronics > 2015 > 103 > Complete > 199-201
Solid-State Electronics > 2014 > 92 > C > 52-56
IEEE Transactions on Electron Devices > 2014 > 61 > 6 > 1972 - 1978
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 766 - 768
IEEE Transactions on Electron Devices > 2014 > 61 > 3 > 926 - 929