Search results for: Zhengxuan Zhang
International Journal of Circuit Theory and Applications > 51 > 8 > 3938 - 3948
International Journal of Circuit Theory and Applications > 51 > 2 > 955 - 962
Microwave and Optical Technology Letters > 63 > 5 > 1552 - 1557
Microwave and Optical Technology Letters > 62 > 7 > 2451 - 2457
Microelectronics Reliability > 2017 > 75 > C > 135-141
Microelectronics Reliability > 2017 > 74 > C > 74-80
Microelectronics Reliability > 2017 > 74 > C > 1-8
Solid-State Electronics > 2017 > 130 > C > 15-19
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-2 > 683 - 688
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-2 > 2369 - 2376
IEEE Transactions on Nuclear Science > 2016 > 63 > 5-2 > 2731 - 2737
Microelectronics Reliability > 2016 > 57 > C > 1-9
Microelectronics Reliability > 2016 > 56 > C > 1-9
IEEE Transactions on Nuclear Science > 2015 > 62 > 1-2 > 314 - 322
Microelectronics Journal > 2014 > 45 > 6 > 759-766
Nuclear Inst. and Methods in Physics Research, A > 2014 > 748 > Complete > 70-78
Nuclear Inst. and Methods in Physics Research, A > 2014 > 745 > Complete > 128-132
Microelectronics Reliability > 2014 > 54 > 4 > 730-737
Nuclear Inst. and Methods in Physics Research, B > 2014 > 319 > Complete > 141-145