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IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4386 - 4392
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3126 - 3131
IEEE Electron Device Letters > 2017 > 38 > 7 > 835 - 838
IEEE Electron Device Letters > 2017 > 38 > 6 > 779 - 782
IEEE Electron Device Letters > 2017 > 38 > 5 > 677 - 680
2017 IEEE International Reliability Physics Symposium (IRPS) > 3C-4.1 - 3C-4.6
2017 IEEE International Reliability Physics Symposium (IRPS) > 2D-5.1 - 2D-5.6
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 73 - 77
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 541 - 548
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 522 - 531
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4346 - 4351
IEEE Journal of the Electron Devices Society > 2016 > 4 > 6 > 424 - 429
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2268 - 2274
IEEE Electron Device Letters > 2016 > 37 > 5 > 644 - 647
2016 IEEE International Reliability Physics Symposium (IRPS) > 5A-3-1 - 5A-3-7
IEEE Electron Device Letters > 2016 > 37 > 4 > 474 - 477