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2013 IEEE International Electron Devices Meeting > 29.5.1 - 29.5.4
2011 International Reliability Physics Symposium > 3F.1.1 - 3F.1.7
2010 IEEE CPMT Symposium Japan > 1 - 4
2013 IEEE International Electron Devices Meeting > 29.5.1 - 29.5.4
2011 International Reliability Physics Symposium > 3F.1.1 - 3F.1.7
2010 IEEE CPMT Symposium Japan > 1 - 4