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IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 3 > 484 - 489
IEEE Electron Device Letters > 2011 > 32 > 8 > 1047 - 1049
IEEE Transactions on Semiconductor Manufacturing > 2009 > 22 > 1 > 126 - 133
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 3 > 484 - 489
IEEE Electron Device Letters > 2011 > 32 > 8 > 1047 - 1049
IEEE Transactions on Semiconductor Manufacturing > 2009 > 22 > 1 > 126 - 133