Search results for: J. S. Suehle
2013 IEEE International Reliability Physics Symposium (IRPS) > 2D.5.1 - 2D.5.4
2011 International Reliability Physics Symposium > 3A.4.1 - 3A.4.5
IEEE Electron Device Letters > 2011 > 32 > 1 > 75 - 77
IEEE Electron Device Letters > 2011 > 32 > 8 > 1047 - 1049
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 4 > 482 - 491
Solid State Electronics > 1997 > 41 > 7 > 1013-1020
Journal of Electronic Materials > 1997 > 26 > 2 > 90-96
IEEE Transactions on Nuclear Science > 1987 > 34 > 6-I > 1359 - 1365
IEEE Transactions on Nuclear Science > 1986 > 33 > 6-I > 1228 - 1233