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IEEE Transactions on Instrumentation and Measurement > 2014 > 63 > 5 > 1032 - 1040
2008 International SoC Design Conference > 1 > I-342 - I-345
2008 Congress on Image and Signal Processing > 2 > 630 - 634
IEEE Transactions on Instrumentation and Measurement > 2014 > 63 > 5 > 1032 - 1040
2008 International SoC Design Conference > 1 > I-342 - I-345
2008 Congress on Image and Signal Processing > 2 > 630 - 634