Search results
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 9 > 2449 - 2457
IEEE Transactions on Electron Devices > 2015 > 62 > 10 > 3272 - 3277
IEEE Transactions on Semiconductor Manufacturing > 2015 > 28 > 3 > 329 - 336
2015 IEEE International Reliability Physics Symposium > 3D.1.1 - 3D.1.8
IEEE Journal of Solid-State Circuits > 2013 > 48 > 3 > 814 - 826
IEEE Transactions on Semiconductor Manufacturing > 2012 > 25 > 2 > 130 - 135
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 945 - 952
IEEE Electron Device Letters > 2011 > 32 > 6 > 734 - 736
IEEE Transactions on Semiconductor Manufacturing > 2011 > 24 > 2 > 280 - 293
IEEE Transactions on Electron Devices > 2011 > 58 > 9 > 2944 - 2951
IEEE Transactions on Electron Devices > 2011 > 58 > 10 > 3626 - 3629