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IEEE Transactions on Microwave Theory and Techniques > 2016 > 64 > 6 > 1745 - 1751
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2288 - 2292
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2469 - 2473
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1821 - 1826
IEEE Electron Device Letters > 2016 > 37 > 5 > 633 - 635
IEEE Transactions on Industrial Electronics > 2016 > 63 > 4 > 2092 - 2102
2016 IEEE International Reliability Physics Symposium (IRPS) > PI-2-1 - PI-2-4
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1464 - 1470
IEEE Electron Device Letters > 2016 > 37 > 3 > 253 - 256
IEEE Electron Device Letters > 2016 > 37 > 3 > 314 - 316
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 1388 - 1391
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 925 - 932
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 2 > 521 - 529