Search results for: Fabian Zarate-Rincon
Microelectronics Reliability > 2017 > 69 > C > 1-16
IEEE Microwave and Wireless Components Letters > 2016 > 26 > 9 > 693 - 695
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1821 - 1826
IEEE Transactions on Microwave Theory and Techniques > 2016 > 64 > 1 > 125 - 132
IEEE Transactions on Microwave Theory and Techniques > 2015 > 63 > 12-2 > 4255 - 4262
IEEE Transactions on Microwave Theory and Techniques > 2014 > 62 > 12-2 > 3255 - 3261
IEEE Transactions on Electron Devices > 2013 > 60 > 8 > 2450 - 2456
Microelectronics Journal > 2008 > 39 > 11 > 1331-1332