Search results for: W. Guo
Electronics Letters > 2017 > 53 > 12 > 814 - 816
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 130 - 136
Electronics Letters > 2016 > 52 > 13 > 1094 - 1096
Electronics Letters > 2016 > 52 > 6 > 450 - 452
2015 IEEE International Electron Devices Meeting (IEDM) > 3.1.1 - 3.1.4
IEEE Electron Device Letters > 2015 > 36 > 6 > 546 - 548
2014 IEEE International Electron Devices Meeting > 7.1.1 - 7.1.4
2014 IEEE International Reliability Physics Symposium > PI.2.1 - PI.2.5
IEEE Electron Device Letters > 2014 > 35 > 11 > 1088 - 1090