Search results for: Dan Alexandrescu
Microprocessors and Microsystems > 2017 > 54 > C > 14-25
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 1 - 2
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 81 - 88
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2268 - 2275
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2015 > 34 > 10 > 1586 - 1599
IEEE Transactions on Nuclear Science > 2015 > 62 > 4-1 > 1642 - 1649
2015 IEEE International Reliability Physics Symposium > SE.6.1 - SE.6.6