Search results for: Issam Nofal
Journal of Electronic Testing > 2019 > 35 > 1 > 111-117
Microelectronics Reliability > 2018 > 87 > C > 24-32
IEEE Transactions on Nuclear Science > 2016 > 63 > 6 > 2934 - 2940
IEEE Transactions on Nuclear Science > 2015 > 62 > 4-1 > 1642 - 1649