Search results for: Gilson Inácio Wirth
Journal of Electronic Testing > 2018 > 34 > 6 > 735-747
Microelectronics Reliability > 2018 > 80 > C > 278-283
IEEE Transactions on Nuclear Science > 2011 > 58 > 4-2 > 1927 - 1934
Journal of Electronic Testing > 2018 > 34 > 6 > 735-747
Microelectronics Reliability > 2018 > 80 > C > 278-283
IEEE Transactions on Nuclear Science > 2011 > 58 > 4-2 > 1927 - 1934