Search results for: J.B. Bernstein
Microelectronics Reliability > 2012 > 52 > 12 > 3011-3016
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 476 - 482
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 339 - 347
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 98 - 121
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 4 > 635 - 641
IEEE Transactions on Electron Devices > 2008 > 55 > 8 > 2004 - 2012
IEEE Transactions on Electron Devices > 2007 > 54 > 6 > 1338 - 1345
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 235 - 246
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 247 - 257