Search results for: J.B. Bernstein
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 339 - 347
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 235 - 246
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 339 - 347
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 235 - 246