Search results for: C. H. Chen
Electronics Letters > 2016 > 52 > 9 > 697 - 699
IEEE Transactions on Electron Devices > 2015 > 62 > 4 > 1360
2013 IEEE International Electron Devices Meeting > 2.6.1 - 2.6.4
2013 IEEE International Reliability Physics Symposium (IRPS) > BD.3.1 - BD.3.5