Search results for: Marcelo A. Pavanello
Solid State Electronics > 2013 > 89 > Complete > 7-11
Microelectronics Reliability > 2011 > 51 > 12 > 2044-2048
IEEE Electron Device Letters > 2011 > 32 > 10 > 1322 - 1324
Solid State Electronics > 2013 > 89 > Complete > 7-11
Microelectronics Reliability > 2011 > 51 > 12 > 2044-2048
IEEE Electron Device Letters > 2011 > 32 > 10 > 1322 - 1324