Search results for: Runsheng Wang
2015 IEEE International Electron Devices Meeting (IEDM) > 11.5.1 - 11.5.4
2015 IEEE International Electron Devices Meeting (IEDM) > 11.7.1 - 11.7.4
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 384 - 393
2015 IEEE International Reliability Physics Symposium > CA.7.1 - CA.7.5
IEEE Transactions on Electron Devices > 2014 > 61 > 5 > 1284 - 1291
2013 IEEE International Electron Devices Meeting > 33.5.1 - 33.5.4
2010 International Electron Devices Meeting > 34.6.1 - 34.6.4
IEEE Transactions on Electron Devices > 2010 > 57 > 12 > 3442 - 3450
IEEE Transactions on Electron Devices > 2010 > 57 > 11 > 2864 - 2871
IEEE Electron Device Letters > 2008 > 29 > 3 > 242 - 245