Search results for: Pengpeng Ren
2015 IEEE International Electron Devices Meeting (IEDM) > 11.7.1 - 11.7.4
2015 IEEE International Reliability Physics Symposium > CA.7.1 - CA.7.5
2014 IEEE International Electron Devices Meeting > 21.4.1 - 21.4.4
2014 IEEE International Electron Devices Meeting > 12.6.1 - 12.6.4
2014 IEEE International Electron Devices Meeting > 34.5.1 - 34.5.4
2014 IEEE International Electron Devices Meeting > 34.1.1 - 34.1.4
2014 IEEE International Reliability Physics Symposium > 2D.3.1 - 2D.3.6
2014 IEEE International Reliability Physics Symposium > XT.14.1 - XT.14.4
2013 IEEE International Electron Devices Meeting > 31.4.1 - 31.4.4
2012 International Electron Devices Meeting > 19.5.1 - 19.5.4