Search results for: Tong-Yu Hsieh
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 9 > 2434 - 2448
Microelectronics Journal > 2017 > 66 > C > 48-57
Microsystem Technologies > 2018 > 24 > 1 > 59-69
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 2 > 784 - 788
Journal of Electronic Testing > 2015 > 31 > 5-6 > 427-441
Journal of Electronic Testing > 2014 > 30 > 6 > 687-699
Journal of Electronic Testing > 2014 > 30 > 6 > 673-685
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2013 > 32 > 1 > 152 - 164
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2013 > 32 > 8 > 1254 - 1264