Search results for: S. Rzepka
Microelectronics Reliability > 2018 > 87 > C > 238-244
Studia Quaternaria > 2017 > Vol. 34, Nr 2 > 99--108
Microelectronics Reliability > 2016 > 64 > C > 276-280
Studia Quaternaria > 2016 > Vol. 33, Nr 1 > 47--56