Search results for: M Narihiro
2012 International Electron Devices Meeting > 18.8.1 - 18.8.3
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 98 - 105
IEEE Transactions on Electron Devices > 2009 > 56 > 8 > 1579 - 1587
2007 IEEE International Electron Devices Meeting > 151 - 154
Microelectronic Engineering > 2000 > 53 > 1-4 > 329-332