Search results for: T. Iwamatsu
2013 IEEE International Electron Devices Meeting > 33.2.1 - 33.2.4
2010 IEEE International Reliability Physics Symposium > 1001 - 1003
Solid State Electronics > 2009 > 53 > 7 > 717-722
IEEE Transactions on Electron Devices > 2008 > 55 > 1 > 365 - 371
2007 IEEE International Electron Devices Meeting > 475 - 478