Search results for: G. Reimbold
Journal of Electronic Materials > 2019 > 48 > 10 > 6113-6117
Solid-State Electronics > 2018 > 139 > C > 88-93
Microelectronics Reliability > 2017 > 79 > C > 111-118
2017 IEEE International Reliability Physics Symposium (IRPS) > 3E-4.1 - 3E-4.6
Solid-State Electronics > 2017 > 128 > C > 10-16
Electronics Letters > 2016 > 52 > 23 > 1935 - 1937
Solid-State Electronics > 2016 > 125 > C > 175-181
Microelectronics Reliability > 2016 > 63 > C > 1-10
2016 IEEE International Reliability Physics Symposium (IRPS) > PR-1-1 - PR-1-4
Solid State Electronics > 2015 > 113 > Complete > 127-131