Search results for: S. Barraud
Microelectronics Reliability > 2017 > 79 > C > 111-118
Solid-State Electronics > 2017 > 131 > C > 20-23
2017 IEEE International Reliability Physics Symposium (IRPS) > 3E-4.1 - 3E-4.6
IEEE Electron Device Letters > 2017 > 38 > 4 > 414 - 417
physica status solidi (b) > 254 > 3 > n/a - n/a
Solid-State Electronics > 2017 > 128 > C > 155-162
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2061 - 2068
2016 IEEE International Electron Devices Meeting (IEDM) > 17.6.1 - 17.6.4
2016 IEEE International Electron Devices Meeting (IEDM) > 13.4.1 - 13.4.4
2016 IEEE International Electron Devices Meeting (IEDM) > 7.5.1 - 7.5.4
Solid-State Electronics > 2016 > 125 > C > 175-181