Search results for: A. Vais
IEEE Journal of the Electron Devices Society > 2017 > 5 > 6 > 480 - 484
2017 IEEE International Reliability Physics Symposium (IRPS) > 2B-3.1 - 2B-3.5
IEEE Electron Device Letters > 2017 > 38 > 3 > 314 - 317
2015 IEEE International Electron Devices Meeting (IEDM) > 31.1.1 - 31.1.4
Microelectronic Engineering > 2015 > 147 > C > 314-317
2015 IEEE International Reliability Physics Symposium > 5A.7.1 - 5A.7.6
Electroanalysis > 23 > 5 > 1073 - 1080
2009 Conference for Visual Media Production > 135 - 143
Experimental Neurology > 2008 > 213 > 2 > 419-430
Russian Journal of Electrochemistry > 2006 > 42 > 3 > 239-244
Russian Journal of Electrochemistry > 2004 > 40 > 2 > 123-129
Russian Journal of Electrochemistry > 2004 > 40 > 7 > 755-759
Russian Journal of Electrochemistry > 2001 > 37 > 3 > 244-249