Search results for: M. Bafleur
Microelectronics Reliability > 2017 > 76-77 > C > 685-691
Microelectronics Reliability > 2016 > 64 > C > 88-92
Microelectronics Reliability > 2015 > 55 > 11 > 2276-2283
Microelectronics Reliability > 2015 > 55 > 9-10 > 1476-1480
Microelectronics Reliability > 2014 > 54 > 9-10 > 2272-2277
Microelectronics Reliability > 2013 > 53 > 9-11 > 1278-1283
Microelectronics Reliability > 2013 > 53 > 2 > 221-228
Microelectronics Reliability > 2011 > 51 > 9-11 > 1980-1984
Microelectronics Reliability > 2011 > 51 > 9-11 > 1990-1994
EOS/ESD Symposium Proceedings > 1 - 9
EOS/ESD Symposium Proceedings > 1 - 8
Microelectronics Reliability > 2010 > 50 > 9-11 > 1379-1382
IEEE Transactions on Nuclear Science > 2010 > 57 > 4-1 > 1900 - 1907