Search results for: M. Huang
2013 IEEE International Electron Devices Meeting > 31.2.1 - 31.2.4
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2013 > 21 > 10 > 1837 - 1848
2012 International Electron Devices Meeting > 30.1.1 - 30.1.4
2012 International Electron Devices Meeting > 19.2.1 - 19.2.4
2011 9th IEEE International Conference on ASIC > 558 - 561
2011 International Reliability Physics Symposium > XT.9.1 - XT.9.2
IEEE Electron Device Letters > 2011 > 32 > 4 > 461 - 463