Search results for: Ingrid de Wolf
Microelectronics Reliability > 2017 > 79 > C > 297-305
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 549 - 559
Advanced Engineering Materials > 19 > 8 > n/a - n/a
Advanced Engineering Materials > 19 > 8 > n/a - n/a
physica status solidi c > 14 > 7 > n/a - n/a
2017 IEEE International Reliability Physics Symposium (IRPS) > 6B-3.1 - 6B-3.8
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 2 > 221 - 228
IEEE Design & Test > 2016 > 33 > 3 > 37 - 45
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2016 > 6 > 6 > 946 - 953
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2321 - 2327
2016 IEEE International Reliability Physics Symposium (IRPS) > 5B-3-1 - 5B-3-8
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2016 > 6 > 4 > 653 - 662
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2016 > 6 > 3 > 424 - 431
Microelectronics Reliability > 2016 > 56 > C > 93-100