Search results for: Melina Lofrano
Microelectronics Reliability > 2018 > 87 > C > 97-105
2012 IEEE International Reliability Physics Symposium (IRPS) > 6B.4.1 - 6B.4.6
Thin Solid Films > 2011 > 520 > 1 > 662-666
Microelectronic Engineering > 2011 > 88 > 5 > 614-619