Search results for: Victor Champac
Journal of Electronic Testing > 2019 > 35 > 1 > 87-100
Journal of Electronic Testing > 2018 > 34 > 2 > 123-134
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 7 > 2438 - 2448
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 1 > 378 - 382
Journal of Electronic Testing > 2016 > 32 > 3 > 307-314
Microelectronics Journal > 2015 > 46 > 5 > 398-403
Microelectronics Reliability > 2015 > 55 > 6 > 1005-1011